Handbook of Optical Metrology: Principles and Applications, 2nd Edition: Book ReviewThe broad collection of metrology applications and the introductory descriptions of the principles make the book a good one to have on hand for those who are frequently searching for technical solutions for their applications both in research and in industry. While individual applications may be scattered in the many professional journals, these topics are cohesively assembled in this handbook. Kobayashi, University of Washington, Seattle, USA "The material of this book is written at an introductory level that should be understandable to anyone with an engineering background. The book starts with a very useful background section on optical component technology that helps to set the stage for subsequent chapters on optical techniques. The discussion of optical metrology techniques focuses on the practical implementation and instrumentation rather than the science and research areas that would be beyond the scope of those without specific background in each area. In doing so, the book focuses on practical understanding of the methods rather than theory.
Handbook of Optical Metrology: Principles and Applications, Second Edition
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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:. This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. Search all titles.
Request PDF on ResearchGate | On Feb 1, , Toru Yoshizawa and others published Handbook of Optical Metrology: Principles and Applications.
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